Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart
2001
Conference Paper
mms
Author(s): | Plachke, D. and Blohm, G. and Fischer, T. and Khellaf, A. and Kruse, O. and Stoll, H. and Carstanjen, H. D. |
Book Title: | Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry |
Volume: | 576 |
Pages: | 458--462 |
Year: | 2001 |
Series: | {American Institute of Physics Conference Proceedings} |
Publisher: | AIP |
Department(s): | Modern Magnetic Systems |
Bibtex Type: | Conference Paper (inproceedings) |
Address: | Denton, Texas |
Language: | eng |
BibTex @inproceedings{escidoc:0950, title = {{Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart}}, author = {Plachke, D. and Blohm, G. and Fischer, T. and Khellaf, A. and Kruse, O. and Stoll, H. and Carstanjen, H. D.}, booktitle = {{Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry}}, volume = {576}, pages = {458--462}, series = {{American Institute of Physics Conference Proceedings}}, publisher = {AIP}, address = {Denton, Texas}, year = {2001}, doi = {} } |