Header logo is

{Focused ion beam micromachining enables novel optics for X-ray microscopy}

2015

Article

mms


Author(s): Keskinbora, K. and Sanli, U. and Grévent, C. and Hirscher, M. and Schütz, G.
Journal: {Microscopy and Microanalysis}
Volume: 21
Number (issue): Suppl 3
Pages: 1983--1984
Year: 2015
Publisher: Springer-Verlag New York

Department(s): Modern Magnetic Systems
Bibtex Type: Article (article)

Address: New York, NY
DOI: 10.1017/S1431927615010697
Language: eng

BibTex

@article{escidoc:0114,
  title = {{Focused ion beam micromachining enables novel optics for X-ray microscopy}},
  author = {Keskinbora, K. and Sanli, U. and Gr\'event, C. and Hirscher, M. and Sch\"utz, G.},
  journal = {{Microscopy and Microanalysis}},
  volume = {21},
  number = {Suppl 3},
  pages = {1983--1984},
  publisher = {Springer-Verlag New York},
  address = {New York, NY},
  year = {2015}
}