Atomic force microscope probe based controlled pushing for nanotribological characterization
2004
Article
pi
Author(s): | Sitti, Metin |
Journal: | IEEE/ASME Transactions on mechatronics |
Volume: | 9 |
Number (issue): | 2 |
Pages: | 343--349 |
Year: | 2004 |
Publisher: | IEEE |
Department(s): | Physische Intelligenz |
Bibtex Type: | Article (article) |
BibTex @article{sitti2004atomic, title = {Atomic force microscope probe based controlled pushing for nanotribological characterization}, author = {Sitti, Metin}, journal = {IEEE/ASME Transactions on mechatronics}, volume = {9}, number = {2}, pages = {343--349}, publisher = {IEEE}, year = {2004}, doi = {} } |