Focused ion beam micromachining enables novel optics for X-ray microscopy
2015
Article
mms
Author(s): | Keskinbora, K. and Sanli, U. and Grévent, C. and Hirscher, M. and Schütz, G. |
Journal: | {Microscopy and Microanalysis} |
Volume: | 21 |
Number (issue): | Suppl 3 |
Pages: | 1983--1984 |
Year: | 2015 |
Publisher: | Springer-Verlag New York |
Department(s): | Moderne Magnetische Systeme |
Bibtex Type: | Article (article) |
Address: | New York, NY |
DOI: | 10.1017/S1431927615010697 |
Language: | eng |
BibTex @article{escidoc:0114, title = {{Focused ion beam micromachining enables novel optics for X-ray microscopy}}, author = {Keskinbora, K. and Sanli, U. and Gr\'event, C. and Hirscher, M. and Sch\"utz, G.}, journal = {{Microscopy and Microanalysis}}, volume = {21}, number = {Suppl 3}, pages = {1983--1984}, publisher = {Springer-Verlag New York}, address = {New York, NY}, year = {2015}, doi = {10.1017/S1431927615010697} } |