@article{escidoc:4123503, title = {Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy}, author = {Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.}, journal = {Thin Solid Films}, volume = {517}, number = {6}, pages = {2048-2054}, year = {2009}, doi = {10.1016/j.tsf.2008.10.058} }